Scanned Gate Microscopy of a Carbon Nanotube
Scanned Gate Microscopy is a powerful new tool which has the potential to image individual electrons on a semi-conducting nanotube. Our work examines this possibility theoretically by analyzing electron transport through quantum dots.
Nano-Ripples in Silicon Using a Focused Ion Beam
Nano-ripples are self organized structures which are imperfectly understood. The talk will focus on linear stability theory (situations in which ripples do not form), as well statistical simulations.